Serial Key Dust Settle [ Chrome GENUINE ]

[ D(t) = D(0) \cdot e^-t / \tau ]

where ( P_t ) is the attacker’s belief after ( t ) failed attempts. The ( T_s ) is the smallest ( t ) such that ( D(t) < \epsilon ) (e.g., ( \epsilon = 10^-6 ) bits). 3. Main Theorem: Exponential Dust Decay Theorem 1 (Exponential Settling). For a serial key with ( m ) unknown symbols and no validation bias (uniformly valid completions), the dust settles according to: serial key dust settle

| Attempts (log2) | KL Divergence (bits) | |----------------|----------------------| | 0 | 8.000 | | 10 | 7.998 | | 20 | 7.125 | | 30 | 3.210 | | 34 | 0.008 (< ε) | [ D(t) = D(0) \cdot e^-t / \tau

At each guess, the attacker removes one possible completion from the keyspace. The probability distribution shifts from a delta peak (one candidate guessed) toward uniform. The KL divergence decreases proportionally to the fraction of remaining untested keys. Solving the difference equation yields exponential decay. ∎ 4. Implications for License System Design The "settling" phenomenon implies that an attacker who learns any non-trivial prefix can reduce the effective keyspace exponentially fast. For example, with ( n=20, m=10 ) unknown chars (( \approx 50 ) bits entropy), the dust settles after approximately ( 2^49 ) guesses—still infeasible. However, if validation logic introduces bias (e.g., only 1% of random strings pass checksum), then ( N_\textvalid ) is small, and settling occurs rapidly. Main Theorem: Exponential Dust Decay Theorem 1 (Exponential

[ H(K | K_P) = |U| \log_2 32 ]